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TIDA-00489: Test probes for functional tests after production

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Part Number:TIDA-00489

Hey guys,

we are planning to manufacture PIR sensors using the TIDA 00489 design. We will need a test bench to ensure the produced sensors are working.

We are currently planing test pins:

  • VCC
  • GND
  • Comparator outputs (low and high)
  • Additional test pins to allow flashing: Reset, JTAG_TMS, JTAG_TCK

We are going to remove the JTAG in series production, thus we need the additional test pins to allow flashing.

We have planed the following functional tests of the device:

  • Current consumption, to verify now leakage currents and correct RF current consumption behavior
  • RF tests
  • PIR motion detection tests: HwI if one of the comparators triggers

Do you have any suggestions, if we should add test pins or if you would suggest further device testing?

kind regards

Slev1n


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